Imaging of Perovskite Photoactive Layer Cross-Section by Atomic Force Microscopy

Abstract

The volume structure of photoactive layer has critical influence on perovskite solar cell performance and life time. In this study the perovskite photoactive layer cross-section was prepared by using Focused Ion Beam (FIB) and imaged by using Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) methods (Fig. 16). Two different types of perovskite layers were investigated: FAPbBr3 and MAPbBr3.