Imaging of Perovskite Photoactive Layer Cross-Section by Atomic Force Microscopy
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Date
2018-08-08
Authors
Alekseev, Alexander
Migunov, Denis
Kozmin, Alexander
Eidelman, Kseniya
Saranin, Danila
Ermanova, Inga
Journal Title
Journal ISSN
Volume Title
Publisher
The 6th International Conference on Nanomaterials and Advanced Energy Storage Systems. Institute of Batteries LLP, Nazarbayev University, and PI “National Laboratory Astana”.
Abstract
The volume structure of photoactive layer has critical influence on perovskite solar cell performance and life time. In this study the perovskite photoactive layer cross-section was prepared by using Focused Ion Beam (FIB) and imaged by using Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) methods (Fig. 16). Two different types of perovskite layers were investigated: FAPbBr3 and MAPbBr3.
Description
Keywords
Scanning Electron Microscopy (SEM), Focused Ion Beam (FIB), Atomic Force Microscopy (AFM)
Citation
Alekseev, Alexander et al. (2018) Imaging of Perovskite Photoactive Layer Cross-Section by Atomic Force Microscopy. The 6th International Conference on Nanomaterials and Advanced Energy Storage Systems. Institute of Batteries LLP, Nazarbayev University, and PI “National Laboratory Astana”. p57.