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Imaging of Perovskite Photoactive Layer Cross-Section by Atomic Force Microscopy

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dc.contributor.author Alekseev, Alexander
dc.contributor.author Migunov, Denis
dc.contributor.author Kozmin, Alexander
dc.contributor.author Eidelman, Kseniya
dc.contributor.author Saranin, Danila
dc.contributor.author Ermanova, Inga
dc.date.accessioned 2018-09-05T10:49:49Z
dc.date.available 2018-09-05T10:49:49Z
dc.date.issued 2018-08-08
dc.identifier.citation Alekseev, Alexander et al. (2018) Imaging of Perovskite Photoactive Layer Cross-Section by Atomic Force Microscopy. The 6th International Conference on Nanomaterials and Advanced Energy Storage Systems. Institute of Batteries LLP, Nazarbayev University, and PI “National Laboratory Astana”. p57. en_US
dc.identifier.uri http://nur.nu.edu.kz/handle/123456789/3475
dc.description.abstract The volume structure of photoactive layer has critical influence on perovskite solar cell performance and life time. In this study the perovskite photoactive layer cross-section was prepared by using Focused Ion Beam (FIB) and imaged by using Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) methods (Fig. 16). Two different types of perovskite layers were investigated: FAPbBr3 and MAPbBr3. en_US
dc.language.iso en en_US
dc.publisher The 6th International Conference on Nanomaterials and Advanced Energy Storage Systems. Institute of Batteries LLP, Nazarbayev University, and PI “National Laboratory Astana”. en_US
dc.rights Attribution-NonCommercial-ShareAlike 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-sa/3.0/us/ *
dc.subject Scanning Electron Microscopy (SEM) en_US
dc.subject Focused Ion Beam (FIB) en_US
dc.subject Atomic Force Microscopy (AFM) en_US
dc.title Imaging of Perovskite Photoactive Layer Cross-Section by Atomic Force Microscopy en_US
dc.type Abstract en_US
workflow.import.source science


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