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Browsing Abstracts by Subject "Atomic Force Microscopy (AFM)"
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Item Open Access Imaging of Perovskite Photoactive Layer Cross-Section by Atomic Force Microscopy(The 6th International Conference on Nanomaterials and Advanced Energy Storage Systems. Institute of Batteries LLP, Nazarbayev University, and PI “National Laboratory Astana”., 2018-08-08) Alekseev, Alexander; Migunov, Denis; Kozmin, Alexander; Eidelman, Kseniya; Saranin, Danila; Ermanova, IngaThe volume structure of photoactive layer has critical influence on perovskite solar cell performance and life time. In this study the perovskite photoactive layer cross-section was prepared by using Focused Ion Beam (FIB) and imaged by using Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) methods (Fig. 16). Two different types of perovskite layers were investigated: FAPbBr3 and MAPbBr3.