Crystallographic Characterisation of Ultra-Thin, or Amorphous Transparent Conducting Oxides—The Case for Raman Spectroscopy
| dc.contributor.author | Caffrey, David | |
| dc.contributor.author | Zhussupbekova, Ainur | |
| dc.contributor.author | Vijayaraghavan, Rajani K. | |
| dc.contributor.author | Ainabayev, Ardak | |
| dc.contributor.author | Kaisha, Aitkazy | |
| dc.contributor.author | Sugurbekova, Gulnar | |
| dc.contributor.author | Shvets, Igor V. | |
| dc.contributor.author | Fleischer, Karsten | |
| dc.date.accessioned | 2020-03-18T07:12:47Z | |
| dc.date.available | 2020-03-18T07:12:47Z | |
| dc.date.issued | 2020-01-07 | |
| dc.description.abstract | The electronic and optical properties of transparent conducting oxides (TCOs) are closely linked to their crystallographic structure on a macroscopic (grain sizes) and microscopic (bond structure) level. With the increasing drive towards using reduced film thicknesses in devices and growing interest in amorphous TCOs such as n-type InGaZnO4 (IGZO), ZnSnO3 (ZTO), p-type CuxCrO2, or ZnRh2O4, the task of gaining in-depth knowledge on their crystal structure by conventional X-ray diffraction-based measurements are becoming increasingly difficult. We demonstrate the use of a focal shift based background subtraction technique for Raman spectroscopy specifically developed for the case of transparent thin films on amorphous substrates. Using this technique we demonstrate, for a variety of TCOs CuO, a-ZTO, ZnO:Al), how changes in local vibrational mo | en_US |
| dc.identifier.citation | Caffrey, D., Zhussupbekova, A., Vijayaraghavan, R. K., Ainabayev, A., Kaisha, A., Sugurbekova, G., … Fleischer, K. (2020). Crystallographic characterisation of ultra-thin, or amorphous transparent conducting oxides-the case for Raman spectroscopy. Materials, 13(2). https://doi.org/10.3390/ma13020267 | en_US |
| dc.identifier.uri | https://doi.org/10.3390/ma13020267 | |
| dc.identifier.uri | http://nur.nu.edu.kz/handle/123456789/4531 | |
| dc.language.iso | en | en_US |
| dc.publisher | MDPI | en_US |
| dc.rights | Attribution-NonCommercial-ShareAlike 3.0 United States | * |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/3.0/us/ | * |
| dc.subject | transparent conducting oxide | en_US |
| dc.subject | TCO | en_US |
| dc.subject | Raman spectroscopy | en_US |
| dc.subject | amorphous oxide | en_US |
| dc.subject | oxide electronics | en_US |
| dc.subject | background subtraction | en_US |
| dc.title | Crystallographic Characterisation of Ultra-Thin, or Amorphous Transparent Conducting Oxides—The Case for Raman Spectroscopy | en_US |
| dc.type | Article | en_US |
| workflow.import.source | science |