Browsing 02.National Laboratory Astana by Subject "Secondary Electron Yield (SEY)"

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Secondary electron yield of emissive materials for large-area micro-channel plate detectors: surface composition and film thickness dependencies

Jokela, S. J.; Veryovkin, I. V.; Zinovev, A. V.; Elam, J. W.; Mane, A. U.; Peng, Q.; Insepov, Z. (Physics Procedia, 2012)

The ongoing development of Atomic Layer Deposition (ALD) enables the use of relatively inexpensive and robust borosilicate micro-channel substrates for use as Micro-Channel Plates (MCPs). The surfaces of the channels in ...