Usov, Victor; Ó Coileáin, Cormac; Chaika, Alexander N.; Bozhko, Sergey I.; Semenov, Valery N.; Krasnikov, Sergey; Toktarbaiuly, Olzat; Stoyanov, Stoyan; Shvets, Igor V.
(PHYSICAL REVIEW B, 2020)
Electromigration, due to its technological and scientific significance, has been a subject of extensive studies for many years. We present evidence of electromigration in dielectric materials, namely
C
-plane sapphire, ...
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