Breakdown in RF cavities

dc.contributor.authorNorem, J.
dc.contributor.authorHassanein, A.
dc.contributor.authorInsepov, Z.
dc.contributor.authorKonkashbaev, I.
dc.date.accessioned2017-09-27T04:53:35Z
dc.date.available2017-09-27T04:53:35Z
dc.date.issued2005
dc.description.abstractWe present a simple model of breakdown in rf cavities. For most events this involves tensile stress and tensile strength, however other effects can also contribute. We discuss the effects of different materials, fatigue, high pressure gas, primary and secondary emission sites, local field enhancements, dark currents, secondary emission, work functions, magnetic fields, macro and microscopic fracture mechanisms high current densities, surface and subsurface defects, and astronomical power densities. While primarily devoted to normal conductors, this work also has consequences for superconducting rf surfaces.ru_RU
dc.identifier.citationNorem, J., Hassanein, A., Insepov, Z., & Konkashbaev, I. (2005, May). Breakdown in RF cavities. In Particle Accelerator Conference, 2005. PAC 2005. Proceedings of the (pp. 1886-1888). IEEE.ru_RU
dc.identifier.urihttp://nur.nu.edu.kz/handle/123456789/2715
dc.language.isoenru_RU
dc.publisherProceedings of 2005 Particle Accelerator Conference, Knoxville, Tennesseeru_RU
dc.rightsOpen Access - the content is available to the general publicru_RU
dc.rightsAttribution-NonCommercial-ShareAlike 3.0 United States*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/us/*
dc.subjectrf cavityru_RU
dc.subjectrf breakdownru_RU
dc.subjectrfru_RU
dc.titleBreakdown in RF cavitiesru_RU
dc.typeConference Paperru_RU

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