IoT-Driven Regression Tree Models for Efficient Microwave Dielectric Material Characterization: Addressing Non-Linear Cavity Sensing

dc.contributor.authorAhmad Khusro
dc.contributor.authorZubair Akhter
dc.contributor.authorAbhishek Jha
dc.contributor.authorAtif Shamim
dc.contributor.authorMohammad Hashmi
dc.date.accessioned2025-08-26T11:30:35Z
dc.date.available2025-08-26T11:30:35Z
dc.date.issued2025-01-01
dc.description.abstractInterconnected microwave dielectric sensing nodes have the potential to revolutionize microwave material processing and design, where microwave dielectric materials characterization (MDMC) with high precision and rapid circuit design are crucial. This research presents an Internet of Things (IoT)‑enabled automated MDMC system designed to tackle the non‑linearity challenges in the extended cavity perturbation regime. Utilizing a cylindrical cavity operating in TE₁₁₁ mode at 5 GHz, the proposed MDMC system is extensively trained on a diverse range of materials through numerous full‑wave 3D electromagnetic simulations. The outputs, i.e., relative permittivity and loss tangent, are derived using advanced machine learning models, including Decision Tree (DT) and Ensemble Learning (EL). A comparative analysis that incorporates simulation, measurement, and predicted permittivity values across varying sample dimensions demonstrates the robustness and accuracy of the DT and EL model. This validates the effectiveness of our high‑quality sensor node and sophisticated data processing techniques within an IoT‑centric framework. en
dc.identifier.citationKhusro Ahmad, Akhter Zubair, Jha Abhishek K., Shamim Atif, Hashmi Mohammad S.. (2025). IoT-Driven Regression Tree Models for Efficient Microwave Dielectric Material Characterization: Addressing Non-Linear Cavity Sensing. IEEE Internet of Things Journal. https://doi.org/10.1109/jiot.2025.3575287en
dc.identifier.doi10.1109/jiot.2025.3575287
dc.identifier.urihttps://doi.org/10.1109/jiot.2025.3575287
dc.identifier.urihttps://nur.nu.edu.kz/handle/123456789/10367
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.rightsOpen accessen
dc.source(2025)en
dc.subjectDielectricen
dc.subjectMicrowaveen
dc.subjectComputer scienceen
dc.subjectTree (set theory)en
dc.subjectCharacterization (materials science)en
dc.subjectRegression analysisen
dc.subjectElectronic engineeringen
dc.subjectBiological systemen
dc.subjectMaterials scienceen
dc.subjectOptoelectronicsen
dc.subjectTelecommunicationsen
dc.subjectMachine learningen
dc.subjectMathematicsen
dc.subjectEngineeringen
dc.subjectNanotechnologyen
dc.subjectMathematical analysisen
dc.subjectBiology; type of access: open accessen
dc.titleIoT-Driven Regression Tree Models for Efficient Microwave Dielectric Material Characterization: Addressing Non-Linear Cavity Sensingen
dc.typearticleen

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