In situ TEM investigation of Xe ion irradiation induced defects and bubbles in pure molybdenum single crystal

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dc.contributor.authorYun, D.
dc.contributor.authorKirk, Marquis A.
dc.contributor.authorBaldo, Peter M.
dc.contributor.authorRest, J.
dc.contributor.authorYacout, A. M.
dc.contributor.authorInsepov, Z.
dc.creatorYun, Di
dc.date.accessioned2019-02-01T05:42:16Z
dc.date.available2019-02-01T05:42:16Z
dc.date.issued2013-06-30
dc.description.abstractAbstract In order to study irradiation damage and inert gas bubble formation and growth behaviors, and to provide results and insights useful towards the validation of a multi-scale simulation approach based on a newly developed Xe–Mo inter-atomic potential, in situ Transmission Electron Microscopy (TEM) studies of Xe implantations in pure single crystal Molybdenum (Mo) have been conducted. 300keV and 400keV Xe+ ion beams were used to implant Xe in pre-thinned TEM Mo specimens. The irradiations were conducted at 300°C and 600°C to ion fluence up to 4×1016ions/cm2.In situ TEM characterization allows detailed behaviors of defect clusters to be observed and is very useful in illustrating defect interaction mechanisms and processes. Dislocation loops were found to form at relatively low irradiation fluence levels. The characterization results showed that the free surfaces, formed in the process of producing pre-thinned specimens, play an important role in influencing the behaviors of dislocation loops. Similar characterizations were conducted at high fluence levels where Xe gas bubbles can be clearly observed. Xe gas bubbles were observed to form by a multi-atom nucleation process and they were immobile throughout the irradiation process at both temperatures. Measurements on both the number density and the size of dislocation loops and gas bubbles were taken. The results and implications of the measurements are discussed in this paper.en_US
dc.identifierDOI:10.1016/j.jnucmat.2013.01.305
dc.identifier.citationYun, D., Kirk, M. A., Baldo, P. M., Rest, J., Yacout, A. M., & Insepov, Z. Z. (2013). In situ TEM investigation of Xe ion irradiation induced defects and bubbles in pure molybdenum single crystal. Journal of Nuclear Materials, 437(1-3), 240-249. https://doi.org/10.1016/j.jnucmat.2013.01.305en_US
dc.identifier.issn00223115
dc.identifier.urihttps://www.sciencedirect.com/science/article/pii/S0022311513003462
dc.identifier.urihttp://nur.nu.edu.kz/handle/123456789/3719
dc.language.isoenen_US
dc.publisherJourn al of Nuclear Materialsen_US
dc.relation.ispartofJournal of Nuclear Materials
dc.rightsAttribution-NonCommercial-ShareAlike 3.0 United States*
dc.rights.licensePublished by Elsevier B.V.
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/us/*
dc.titleIn situ TEM investigation of Xe ion irradiation induced defects and bubbles in pure molybdenum single crystalen_US
dc.typeArticleen_US
elsevier.aggregationtypeJournal
elsevier.coverdate2013-06-30
elsevier.coverdisplaydateJune 2013
elsevier.endingpage249
elsevier.identifier.doi10.1016/j.jnucmat.2013.01.305
elsevier.identifier.eid1-s2.0-S0022311513003462
elsevier.identifier.piiS0022-3115(13)00346-2
elsevier.issue.identifier1-3
elsevier.openaccess0
elsevier.openaccessarticlefalse
elsevier.openarchivearticlefalse
elsevier.startingpage240
elsevier.teaser► Xe implantation experiments were performed in single crystal molybdenum. ► Both defect and gas behaviors were investigated in situ by TEM techniques at 300°C and 600°C. ► Mobile dislocation loops...
elsevier.volume437
workflow.import.sourcescience

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