Patch and Model Size Characterization for On-device Efficient-ViTs on Small Datasets using 12 Quantitative Metrics

dc.contributor.authorJurn-Gyu Park
dc.contributor.authorAidar Amangeldi
dc.contributor.authorNail Fakhrutdinov
dc.contributor.authorMeruyert Karzhaubayeva
dc.contributor.authorDimitrios Zorbas
dc.date.accessioned2025-08-26T11:30:50Z
dc.date.available2025-08-26T11:30:50Z
dc.date.issued2025-01-01
dc.description.abstractVision transformers (ViTs) have emerged as a successful alternative to convolutional neural networks (CNNs) in deep learning (DL) applications for computer vision (CV), particularly excelling in accuracy on large‑scale datasets within high‑performance computing (HPC) or cloud domains. However, in the context of resource‑constrained mobile and edge AI devices, there is a lack of systematic and comprehensive investigations into the challenging optimizations for both device‑agnostic (e.g., accuracy and model size) and device‑related (e.g., latency, memory usage, and power/energy consumption) multi‑objectives. To resolve this problem, we first introduce five device‑agnostic (DA) and seven device‑related (DR) quantitative metrics, using which we thoroughly characterize the effects of ViT hyper‑parameters on small datasets in terms of patch size and model size, and then propose a simple yet effective optimization technique called the hierarchical and local (HelLo) tuning method for efficient ViTs. The results show that our method achieves significant improvements of up to 85% in MACs, 67.2% in inference latency, 77.7% in train latency/time, 63.3% in GPU memory, 73.8% in energy consumption, and 263.0% in FoM, with minimal accuracy degradation (up to 2%).en
dc.identifier.citationPark Jurn-Gyu, Amangeldi Aidar, Fakhrutdinov Nail, Karzhaubayeva Meruyert, Zorbas Dimitrios. (2025). Patch and Model Size Characterization for On-Device Efficient-ViTs on Small Datasets Using 12 Quantitative Metrics. IEEE Access. https://doi.org/10.1109/access.2025.3536471en
dc.identifier.doi10.1109/access.2025.3536471
dc.identifier.urihttps://doi.org/10.1109/access.2025.3536471
dc.identifier.urihttps://nur.nu.edu.kz/handle/123456789/10371
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.rightsOpen accessen
dc.source(2025)en
dc.subjectComputer scienceen
dc.subjectCharacterization (materials science)en
dc.subjectData miningen
dc.subjectMaterials scienceen
dc.subjectNanotechnology; type of access: open accessen
dc.titlePatch and Model Size Characterization for On-device Efficient-ViTs on Small Datasets using 12 Quantitative Metricsen
dc.typearticleen

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