Operating experience with the laser ion source relevant the HIF application

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dc.contributor.authorOkamura, Masahiro
dc.contributor.authorIkeda, Shunsuke
dc.contributor.authorKanesue, Takeshi
dc.date.accessioned2016-11-02T11:10:38Z
dc.date.available2016-11-02T11:10:38Z
dc.date.issued2016-07-18
dc.description.abstractSince March 2014, a laser ion source (LIS) has been used to provide high brightness low charge state heavy ion beams for regular routine operation of the hadron accelerator complex in Brookhaven National Laboratory (BNL)[1]. The peak current and pulse width of the typical beams from the LIS are several hundreds of microampere and about 200 microseconds, respectively. Of course, these specifications cannot be directly applied to the HIF. However, only by reducing the plasma drift distance to one tenth, the beam current and pulse width will become 1000 times and 1/10 respectively and these values are not far from the HIF’s requirements. Therefore, it would be useful to discuss some operational difficulties and to investigate what should be improved in the existing LIS in BNL toward the HIF application...ru_RU
dc.identifier.citationOkamura, Masahiro., Ikeda, Shunsuke., Kanesue, Takeshi., (2016) Operating experience with the laser ion source relevant the HIF application. 21st International Symposium on Heavy Ion Inertial Fusion. Autonomous Organization of Education “Nazarbayev University”. Book of Abstracts. http://nur.nu.edu.kz/handle/123456789/1774ru_RU
dc.identifier.urihttp://nur.nu.edu.kz/handle/123456789/1774
dc.language.isoenru_RU
dc.publisher21st International Symposium on Heavy Ion Inertial Fusion. Autonomous Organization of Education “Nazarbayev University”ru_RU
dc.rightsAttribution-NonCommercial-ShareAlike 3.0 United States*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/us/*
dc.subjectlaser ionru_RU
dc.subjectplasmaru_RU
dc.subjectbeamru_RU
dc.subjectResearch Subject Categories::NATURAL SCIENCES::Physics::Elementary particle physicsru_RU
dc.titleOperating experience with the laser ion source relevant the HIF applicationru_RU
dc.typeAbstractru_RU

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