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Intrinsic photoluminescence Stokes shift in semiconductors demonstrated by thin-film CdS formed with pulsed-laser deposition

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dc.contributor.author Ullrich, B.
dc.contributor.author Ariza-Flores, D.
dc.contributor.author Bhowmick, M.
dc.creator B., Ullrich
dc.date.accessioned 2017-12-20T08:18:32Z
dc.date.available 2017-12-20T08:18:32Z
dc.date.issued 2014-05-02
dc.identifier DOI:10.1016/j.tsf.2014.02.047
dc.identifier.citation B. Ullrich, D. Ariza-Flores, M. Bhowmick, Intrinsic photoluminescence Stokes shift in semiconductors demonstrated by thin-film CdS formed with pulsed-laser deposition, In Thin Solid Films, Volume 558, 2014, Pages 24-26 en_US
dc.identifier.issn 00406090
dc.identifier.uri https://www.sciencedirect.com/science/article/pii/S0040609014001825
dc.identifier.uri http://nur.nu.edu.kz/handle/123456789/2960
dc.description.abstract Abstract While not reported in the literature, by employing highly oriented, semi-insulating, thin-film CdS as test material, we present the observation of the intrinsic photoluminescence Stokes shift in a semiconductor. Analysis of Raman peaks, transmission, reflection, and photoluminescence shows that during band-to-band emission at room temperature one-to-two longitudinal optical phonons with energy of 39.8meV are emitted. The result is confirmed by the theoretically expected Huang–Rhys factor. en_US
dc.language.iso en en_US
dc.publisher Thin Solid Films en_US
dc.relation.ispartof Thin Solid Films
dc.subject Stokes shift en_US
dc.subject Pulsed-laser deposition en_US
dc.subject Thin-film CdS en_US
dc.subject Huang–Rhys factor en_US
dc.subject Band gap en_US
dc.subject Raman spectroscopy en_US
dc.subject Phonons en_US
dc.title Intrinsic photoluminescence Stokes shift in semiconductors demonstrated by thin-film CdS formed with pulsed-laser deposition en_US
dc.type Article en_US
dc.rights.license Copyright © 2014 Elsevier B.V. All rights reserved.
elsevier.identifier.doi 10.1016/j.tsf.2014.02.047
elsevier.identifier.eid 1-s2.0-S0040609014001825
elsevier.identifier.pii S0040-6090(14)00182-5
elsevier.identifier.scopusid 84898788484
elsevier.volume 558
elsevier.coverdate 2014-05-02
elsevier.coverdisplaydate 2 May 2014
elsevier.startingpage 24
elsevier.endingpage 26
elsevier.openaccess 0
elsevier.openaccessarticle false
elsevier.openarchivearticle false
elsevier.teaser While not reported in the literature, by employing highly oriented, semi-insulating, thin-film CdS as test material, we present the observation of the intrinsic photoluminescence Stokes shift in a semiconductor....
elsevier.aggregationtype Journal
workflow.import.source science


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