Local electrical properties of PTB7 film

Yedrissov, A.; Alekseev, A.; Ilyassov, B.

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dc.contributor.author	Yedrissov, A.
dc.contributor.author	Alekseev, A.
dc.contributor.author	Ilyassov, B.
dc.date.accessioned	2017-12-20T03:06:58Z
dc.date.available	2017-12-20T03:06:58Z
dc.date.issued	2017-01-01
dc.identifier	DOI:10.1016/j.matpr.2017.04.030
dc.identifier.citation	A.Yedrissov, A.Alekseev, B. Ilyassov, Local electrical properties of PTB7 film, In Materials Today: Proceedings, Volume 4, Issue 3, Part A, 2017, Pages 4561-4566	en_US
dc.identifier.issn	22147853
dc.identifier.uri	https://www.sciencedirect.com/science/article/pii/S221478531730593X
dc.identifier.uri	http://nur.nu.edu.kz/handle/123456789/2950
dc.description.abstract	Abstract A study of the spreading of currents and current-voltage characteristics in a pure PTB7 thin film by atomic force microscopy (AFM) technique was carried out in order to investigate the processes of transport of positive charge carriers in the nanoscale range. It was showed that the numerical values of the carrier mobility can significantly differ on the nanoscale and require correct interpretation of processes with the scale that are comparable with the morphological features of organic solar cells.	en_US
dc.language.iso	en	en_US
dc.publisher	Materials Today: Proceedings	en_US
dc.relation.ispartof	Materials Today: Proceedings
dc.subject	Organic photovoltaic solar cells	en_US
dc.subject	PTB7	en_US
dc.subject	the mobility of the charge carriers	en_US
dc.title	Local electrical properties of PTB7 film	en_US
dc.type	Conference Paper	en_US
dc.rights.license	© 2017 Elsevier Ltd. All rights reserved.
elsevier.identifier.doi	10.1016/j.matpr.2017.04.030
elsevier.identifier.eid	1-s2.0-S221478531730593X
elsevier.identifier.pii	S2214-7853(17)30593-X
elsevier.identifier.scopusid	85020881518
elsevier.volume	4
elsevier.issue.identifier	3
elsevier.issue.name	4th International Conference on Nanomaterials and Advanced Energy Storage Systems (INESS 2016), August 11-13, 2016, Almaty, Kazakhstan
elsevier.coverdate	2017-01-01
elsevier.coverdisplaydate	2017
elsevier.startingpage	4561
elsevier.endingpage	4566
elsevier.openaccess	0
elsevier.openaccessarticle	false
elsevier.openarchivearticle	false
elsevier.teaser	A study of the spreading of currents and current-voltage characteristics in a pure PTB7 thin film by atomic force microscopy (AFM) technique was carried out in order to investigate the processes of...
elsevier.aggregationtype	Journal
workflow.import.source	science