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Local electrical properties of PTB7 film

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dc.contributor.author Yedrissov, A.
dc.contributor.author Alekseev, A.
dc.contributor.author Ilyassov, B.
dc.creator , A.Yedrissov
dc.date.accessioned 2017-12-20T03:06:58Z
dc.date.available 2017-12-20T03:06:58Z
dc.date.issued 2017-01-01
dc.identifier DOI:10.1016/j.matpr.2017.04.030
dc.identifier.citation A.Yedrissov, A.Alekseev, B. Ilyassov, Local electrical properties of PTB7 film, In Materials Today: Proceedings, Volume 4, Issue 3, Part A, 2017, Pages 4561-4566 en_US
dc.identifier.issn 22147853
dc.identifier.uri https://www.sciencedirect.com/science/article/pii/S221478531730593X
dc.identifier.uri http://nur.nu.edu.kz/handle/123456789/2950
dc.description.abstract Abstract A study of the spreading of currents and current-voltage characteristics in a pure PTB7 thin film by atomic force microscopy (AFM) technique was carried out in order to investigate the processes of transport of positive charge carriers in the nanoscale range. It was showed that the numerical values of the carrier mobility can significantly differ on the nanoscale and require correct interpretation of processes with the scale that are comparable with the morphological features of organic solar cells. en_US
dc.language.iso en en_US
dc.publisher Materials Today: Proceedings en_US
dc.relation.ispartof Materials Today: Proceedings
dc.subject Organic photovoltaic solar cells en_US
dc.subject PTB7 en_US
dc.subject the mobility of the charge carriers en_US
dc.title Local electrical properties of PTB7 film en_US
dc.type Conference Paper en_US
dc.rights.license © 2017 Elsevier Ltd. All rights reserved.
elsevier.identifier.doi 10.1016/j.matpr.2017.04.030
elsevier.identifier.eid 1-s2.0-S221478531730593X
elsevier.identifier.pii S2214-7853(17)30593-X
elsevier.identifier.scopusid 85020881518
elsevier.volume 4
elsevier.issue.identifier 3
elsevier.issue.name 4th International Conference on Nanomaterials and Advanced Energy Storage Systems (INESS 2016), August 11-13, 2016, Almaty, Kazakhstan
elsevier.coverdate 2017-01-01
elsevier.coverdisplaydate 2017
elsevier.startingpage 4561
elsevier.endingpage 4566
elsevier.openaccess 0
elsevier.openaccessarticle false
elsevier.openarchivearticle false
elsevier.teaser A study of the spreading of currents and current-voltage characteristics in a pure PTB7 thin film by atomic force microscopy (AFM) technique was carried out in order to investigate the processes of...
elsevier.aggregationtype Journal
workflow.import.source science


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